New, Fast Z-axis Piezo Scanner for Inverted Microscopes Offers Large, Clear Aperture for Wellplates and High Positional Stability

Z axis piezo scanner for

The nanopositioning system for high-resolution microscopy from PI (Physik Instrumente) is characterized by a large clear aperture of 160mm × 110mm, high positional stability, and rapid settling times.

The latest version of the P-736 Z-axis piezo scanner positions wellplates and sample holders for object slides and petri dishes on the optical axis with nanometre precision with a travel range of 200µm.

The P-736’s small overall height of 20mm allows it to be integrated easily into any standard inverted microscope.

The drive technology in the piezo scanner is based on PICMA® piezo actuators with all-ceramic insulation. These are proven to be longer-lasting and less vulnerable to moisture than actuators with conventional polymer insulation, making the overall system outstandingly reliable.

For high-resolution position control, the new version of the P-736 is available with either cost-effective piezoresistive sensors, or capacitive sensors that provide for highest stability.

The piezo scanner is delivered as a complete system with a digital controller. The digital technology improves linearity and allows the flexible adjustment of the servo-control parameters. The controller has USB, RS-232 and analogue interfaces and can therefore be easily integrated into different control systems. It is additionally compatible with µManager, MetaMorph and Andor iQ.


Image: P-736, a new, fast Z axis piezo scanner for inverted microscopes offers large, clear aperture for well plates and high positional stability.

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