Elekta has been granted a patent for systems and methods that involve generating simulated X-ray measurements and updating structural estimates of a region of interest based on real X-ray measurements. The technology aims to improve accuracy in medical imaging and treatment planning. GlobalData’s report on Elekta gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Elekta, Vaping device aerosol generators was a key innovation area identified from patents. Elekta's grant share as of February 2024 was 56%. Grant share is based on the ratio of number of grants to total number of patents.
Medical imaging system with real-time structural estimate updates
A recently granted patent (Publication Number: US11915346B2) discloses a system that includes a memory and one or more processors configured to perform various operations. These operations involve accessing a current structural estimate of a region of interest, generating a simulated X-ray measurement based on this estimate, receiving a real X-ray measurement, and updating the current structural estimate based on both the simulated and real X-ray measurements. The update process is designed to be invariant to the current structural estimate, ensuring accuracy and reliability in the estimation process.
Furthermore, the system described in the patent involves additional operations such as computing updates based on statistical objective functions, linearly projecting updates into image space, applying regularization techniques for stability, and utilizing machine learning models for generating expected X-ray measurements. The system also allows for the iterative generation of simulated and real X-ray measurements, enabling continuous refinement of the structural estimate. Overall, the patent outlines a comprehensive system for improving the accuracy of structural estimates in X-ray imaging, with a focus on stability, efficiency, and adaptability to different measurement scenarios.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
