Shimadzu. has filed a patent for a monitoring device in a material testing machine. The device includes a display with a marker, utilizing image processing to detect the marker for monitoring purposes. GlobalData’s report on Shimadzu gives a 360-degree view of the company including its patenting strategy. Buy the report here.

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According to GlobalData’s company profile on Shimadzu, Image segmentation techniques was a key innovation area identified from patents. Shimadzu's grant share as of January 2024 was 25%. Grant share is based on the ratio of number of grants to total number of patents.

Monitoring device for material testing machine with marker detection

Source: United States Patent and Trademark Office (USPTO). Credit: Shimadzu Corp

The patent application (Publication Number: US20240037725A1) describes a monitoring device for a material testing machine that includes a display with a marker on a display panel. The monitoring device comprises an acquisition unit to acquire a photographed image of the display panel, first, second, and third generation units to process the image, and a first detection unit to detect the marker from the processed image. The device further includes a second detection unit to detect the position of the marker in the image, with the second generation unit adjusting the blur processing filter parameter based on the detection results.

Moreover, the monitoring device includes a trained model that uses machine learning to establish a relationship between the filter parameter value, marker position, and the probability of the marker's existence at that position. The second generation unit adjusts the filter parameter value based on the probability output from the trained model. Additionally, the device specifies a predetermined area of the display panel based on the marker's position detected by the second detection unit. The patent also covers a monitoring system incorporating the described monitoring device, camera, and display panel, highlighting the importance of accurate marker detection and image processing in material testing applications.

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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies