Shimadzu had 23 patents in artificial intelligence during Q1 2024.Shimadzu Corp’s patents in Q1 2024 include an X-ray imaging system that uses machine learning to discriminate areas of inspection targets and defects, as well as calculate three-dimensional positions of target parts. Another patent involves a monitoring device for material testing machines that includes image processing techniques to detect markers on a display panel. GlobalData’s report on Shimadzu gives a 360-degree view of the company including its patenting strategy. Buy the report here.

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Shimadzu grant share with artificial intelligence as a theme is 47% in Q1 2024. Grant share is based on the ratio of number of grants to total number of patents.

Recent Patents

Application: X-ray imaging system and learned model production method (Patent ID: US20240068962A1)

The patent filed by Shimadzu Corp describes an X-ray imaging system that acquires images from a teacher X-ray image of an inspection target and uses discrimination information to identify areas of interest and defects. The system includes components such as an X-ray emitter, detector, image generator, and model producer that performs machine learning using input and output teacher data sets based on the acquired images and discrimination information. The system can be used for analyzing regular arrangements of inspection targets, such as solder material pieces on a substrate, to identify defect parts accurately.

The X-ray imaging system's model producer includes a cut-out image acquirer, discrimination information acquirer, and learning performer to facilitate the machine learning process. The system allows for user input instructions to specify target areas, ranges of images to be cut out, and adjustments for aligning images to a common size. Additionally, the system can acquire background images to exclude inspection targets for more precise analysis. The method described in the patent involves acquiring images, discrimination information, and performing machine learning to produce a learned model for analyzing X-ray images of inspection targets with regular arrangements, providing a comprehensive and efficient solution for defect detection and analysis in X-ray imaging systems.

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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.