Texas Instruments (TI) has introduced a family of high-reliability power management integrated circuits and advanced CMOS (AC) logic devices to increase system-level reliability in applications exposed to long-term radiation and extreme temperatures, such as downhole drilling, x-ray imaging, satellite systems and high-altitude avionics.
The new UC18xx pulse width modulation (PWM) controllers for switching power supply-based applications, plus the new UC1525B-SP, offer improved rate sensitivity, which allows for greater than 30krad(Si) tolerance to low dose rate radiation. In addition, three new parts in TI’s SN54ACxx AC logic family reach a total irradiated dose (TID) level of 50krad(Si) to allow for lower leakage current and improved radiation performance. For complete product information, please see our website.
- UC18xx-SP devices achieve greater than 30krad(Si) tolerance to low dose rate irradiation and provide up to 500KHz voltage/current mode pulse width modulation control
- UC1525B-SP offers a dual output, 250kHz voltage mode PWM controller
- SN54ACxx-SP devices reach up to 50krad(Si) of TID levels of radiation and offer quadruple two-input positive-NOR and NAND gates
- ELDRS radiation test summary available upon request
- Increase long-term system-level reliability up to 30% based on low dose radiation effects
- Reduce expensive repairs, replacement costs and maintenance requirements for critical applications
- Higher ‘critical mission’ life rating; improved devices meet ten to 15-year requirement for satellite mission lifetimes
- Fewer incoming inspection/testing criteria and less system-level shielding requirements
Availability and samples
The new UC18xx-SP devices, the UC1525B-SP and the new SN54ACxx-SP parts are available today through TI and its authorized distributors, and are orderable by their respective QML Class-V Standard Military Drawing (SMD). Please visit our website to order samples or download technical information.